$\newcommand\el{\ell\kern.45mm}$Put more precisely, letting $\mathcal T$ be the $\sigma(\el^2,\el^2)$ topology restricted to the set $\el^2(\mathbb N_0)\cap\{\,x:0<\|\,x\,\|_{\el^2}\le 1\,\}\,$, is there a complete metric metrizing $\mathcal T\,$? I have a "strong feeling" that the answer is yes, and have been trying to construct a metric verifying this "feeling", but with no success so far.
Actually, what I ultimately need is the following: The topology $\sigma(\el^1,c_0)$ restricted to $\el^1(\mathbb N_0)\cap\{\,x:\frac 12<\|\,x\,\|_{\el^1}\le 1\,\}$ is completely metrizable. However, to keep matters as simple as possible, I formulated the above question since I think that the same idea that possibly gives a positive answer to that question can also be applied here.
A related matter is the following: If $\mathcal T$ is any compact metrizable topology on some $\Omega$ with $x_0\in\Omega\,$, and if $\mathcal T_0$ is $\mathcal T$ restricted to $\Omega\setminus\{\,x_0\}\,$, then $\mathcal T_0$ is locally compact, and I "feel" that it should be completely metrizable. A metric verifying this should somehow become "large" near $x_0$ so that sequences converging to $x_0$ in $\mathcal T$ cannot be Cauchy.